Assessment of strengthening the mechanical properties of hair fibers

Atomic force microscopy (AFM) is used to map the topology (i.e. profilometry) of the cuticle while measuring the mechanical properties of adhesion and Young’s modulus in the same area, with nanometric measurement steps.

These measurements are used to assess the quality of the cuticle and its adhesion properties.

Images obtained by atomic force microscopy on the same area: topography or roughness (top), adhesion force (middle), and Young’s modulus (bottom).

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