X-ray Microdiffraction is a diffraction technique that uses a microbeam generated by a synchrotron source. It enables the characterization of atomic or molecular structures in micrometer-sized objects and can produce structural maps of a sample using 1D or 2D scanning modes.
X-ray Diffraction is a technique used to determine the atomic and molecular arrangements within a material by analyzing the intensity and direction of X-ray beams scattered by atoms.
The structural information obtained is especially rich when the material is well-ordered, or “crystalline.” In addition to revealing the crystal structure, this technique provides insights into crystallite size, orientation, and internal stresses. Such data are often essential for understanding a material’s properties and monitoring the effects of treatments. X-ray diffraction is also a powerful tool for quality control and the identification of crystalline substances.
By combining X-ray diffraction with microbeams generated from synchrotron sources, the technique becomes X-ray microdiffraction. This allows for 2D structural mapping and the analysis of micrometer-scale objects.
Diffractometers for reflection or transmission measurements, at grazing incidence or small angles, are available as laboratory equipment or at synchrotron facilities (respectively more accessible or more powerful).
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