X-ray Microdiffraction is a diffraction technique that uses a microbeam generated by a synchrotron source. It enables the characterization of atomic or molecular structures in micrometer-sized objects and can produce structural maps of a sample using 1D or 2D scanning modes.
X-ray Diffraction is a technique used to determine the atomic and molecular arrangements within a material by analyzing the intensity and direction of X-ray beams scattered by atoms.
The structural information obtained is especially rich when the material is well-ordered, or “crystalline.” In addition to revealing the crystal structure, this technique provides insights into crystallite size, orientation, and internal stresses. Such data are often essential for understanding a material’s properties and monitoring the effects of treatments. X-ray diffraction is also a powerful tool for quality control and the identification of crystalline substances.
By combining X-ray diffraction with microbeams generated from synchrotron sources, the technique becomes X-ray microdiffraction. This allows for 2D structural mapping and the analysis of micrometer-scale objects.
Local analysis of the structure of physiological lipids in the stratum corneum involved in the skin’s barrier function
Analysis of the local structure of keratin in hair: monitoring the penetration and effects of hair care products
Characterization of starch structure during food processing
Identification of heterogeneous structures such as skin-core types in thermoplastics
Meticulous preparation of experimental conditions, tailored to each sample type
Data analysis based on the expertise of our specialists in diffraction across various material types
Development of analysis protocols for samples as complex as biological specimens (notably skin and hair)
Custom analysis services: either individually or for large series of samples, in controlled environments if needed
Diffractometers for reflection or transmission measurements, at grazing incidence or small angles, are available as laboratory equipment or at synchrotron facilities (respectively more accessible or more powerful).
Microscopie électronique à balayage basse tension (SEM-FEG)
Microtomographie rayons-X (µCT)
Microtomographie rayons-X in situ
Microscopie à force atomique (AFM)
Diffusion des rayons-X aux petits et grands angles (SAXS, WAXS)
Fluorescence rayons-X en microfaisceaux (µXRF)
Spectroscopies infrarouge (FT-IR) et ultraviolet (UV)
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