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Atomic Force Microscopy

Atomic force microscopy (AFM) is a powerful imaging and characterisation technique at the nanometre scale. Its principle is based on the interaction of a nanotip with the surface of a sample. AFM provides access to a large number of parameters: primarily nanometre-scale topography, but also local mechanical, electrical and magnetic properties.

Assests of Atomic Force Microscopy AFM

Topographical analyses (profilometry) on areas of several µm² with lateral spatial resolution up to approximately 3 nm and vertical resolution of around 0.1 nm.
Surface characterisation of materials by measuring surface roughness, hardness and elasticity in the same observed area.
Characterisation of thin films and coatings: thickness and adhesive properties.

Measurements and analyses using atomic force microscopy (AFM)

Novitom's expertise in AFM analysis

Meticulous preparation of experimental conditions, tailored to each type of sample.
Development of measurement protocols for fragile samples such as biological samples, including skin and hair.
Original experimental approaches, for example for collagen quality assessment using AFM images combined with small-angle X-ray scattering.
Customised measurement and analysis services.

Types d’échantillons

Biological materials: thin sections of skin or other tissue, hair, nails, teeth
All types of materials: metals, composites, ceramics, glass, semiconductors

Anti-aging skincare seen through collagen fibres organisation

Novitom has developed an original test based on the…

Complementarity with other techniques

Small-angle X-ray scattering (SAXS)

Scanning Electron Microscopy (SEM-FEG)

Synchrotron micro-tomography (µCT)

Micro-beam X-ray Fluorescence (µXRF)

Multi-scale tomography

Materials and processes

Health - cosmetics: physical analysis

X-ray tomography

X-ray diffraction and scattering

Microscopy & Spectroscopy

In situ testing devices