3D localisation and visualisation of cracks

Microtomography enables the non-destructive detection and 3D visualization of cracks. It accurately quantifies the size, shape, and volume of cracks, including their propagation depth.

This volumetric measurement capability allows for the assessment of structural integrity, the monitoring of degradation progression, and the optimization of materials. Essential in R&D, it helps prevent failures and improve durability, particularly in the aerospace, automotive, and medical device sectors.

As an independent lab, Novitom enables companies to access synchrotron micro and nano-tomography :

  • Regular access to instruments at synchrotron facilities
  • Know-how in experimental design for real-time microtomography
  • Expertise in extracting information and physical parameters from raw data and in combination with ancillary techniques

Further reading about quantitative non-destructive investigation

Tracking the evolution of materials microstructure : in situ mechanical testing with Novi CT Rig

Tracking the evolution of materials microstructure : in situ mechanical testing with Novi CT Rig

Why perform microCT during tensile/compression tests? The use of microtomography during tensile/compression tests enables the impact of stresses on the…

The microstructure of tablets revealed by synchrotron X-rays

The microstructure of tablets revealed by synchrotron X-rays

A recent study conducted by Xploraytion, Novitom, Merck and their partners shows how the internal structures of tablets are visualised…

Comparison of the scanned full volume of a part with its CAD model

Comparison of the scanned full volume of a part with its CAD model

High-resolution, high-energy X-ray tomography provides non-destructive access to the entire part, including internal areas that are inaccessible to other techniques.…

The microstructure of tablets revealed by synchrotron X-rays

The microstructure of tablets revealed by synchrotron X-rays

A recent study conducted by Xploraytion, Novitom, Merck and…